Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time. - Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Ku-Feng Lin; Ta-Ching Yeh; Hung-Chang Yu; Harry Chuang; Yu-Der Chih; Tsung-Yung Jonathan Chang (VLSI Circuits, 2018)

Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub- $ mu$ A Sensing Resolution, and 17.5-nS Read Access Time. - Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Ku-Feng Lin; Ta-Ching Yeh; Hung-Chang Yu; Harry Chuang; Yu-Der Chih; Tsung-Yung Jonathan Chang (IEEE J. Solid State Circuits, 2019)

13.3 A 22nm 32Mb Embedded STT-MRAM with 10ns Read Speed, 1M Cycle Write Endurance, 10 Years Retention at 150°C and High Immunity to Magnetic Field Interference. - Yu-Der Chih; Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Chieh-Pu Lo; Meng-Chun Shih; Kuei-Hung Shen; Harry Chuang; Tsung-Yung Jonathan Chang (ISSCC, 2020)

An 89TOPS/W and 16.3TOPS/mm2 All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications. - Yu-Der Chih; Po-Hao Lee; Hidehiro Fujiwara; Yi-Chun Shih; Chia-Fu Lee; Rawan Naous; Yu-Lin Chen; Chieh-Pu Lo; Cheng-Han Lu; Haruki Mori; Wei-Cheng Zhao; Dar Sun; et al. (ISSCC, 2021)

A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity. - Po-Hao Lee; Chia-Fu Lee; Yi-Chun Shih; Hon-Jarn Lin; Yen-An Chang; Cheng-Han Lu; Yu-Lin Chen; Chieh-Pu Lo; Chung-Chieh Chen; Cheng-Hsiung Kuo; Tan-Li Chou; Chia-Yu Wang; et al. (ISSCC, 2023)