OCR is All you need: Importing Multi-Modality into Image-based Defect Classification System. - Chih-Chung Hsu; Chia-Ming Lee; Po-Tsun Yu; Chun-Hung Sun; Kuang-Ming Wu (APCCAS, 2024)

Progressive Alignment with VLM-LLM Feature to Augment Defect Classification for the ASE Dataset. - Chih-Chung Hsu; Chia-Ming Lee; Po-Tsun Yu; Cheng-Jun Kang; Chun-Hung Sun; Kuang-Ming Wu (ICCE, 2025)