A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. - Chanhee Oh; Haldun Haznedar; Martin Gall; Amir Grinshpon; Vladimir Zolotov; Pon Sung Ku; Rajendran Panda (ISQED, 2004)

Impact of stress-induced backflow on full-chip electromigration risk assessment. - Haldun Haznedar; Martin Gall; Vladimir Zolotov; Pon Sung Ku; Chanhee Oh; Rajendran Panda (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)