Signal Routing with Temporal Constraints. - P. R. Mukund; V. Mukund; Charles E. Noon (ISCAS, 1993)

MCM: The High-Performance Electronic Packaging Technology. - P. R. Mukund; John F. McDonald 001 (Computer, 1993)

A novel CMOS monolithic analog multiplier with wide input dynamic range. - George A. Hadgis; P. R. Mukund (VLSI Design, 1995)

Analysis of VCO jitter in chip-package co-design. - H. Parthasarathy; Ghanshyam Nayak; Ponnathpur R. Mukund (ISCAS (3), 2002)

1/f noise modeling using discrete-time self-similar systems. - Rajesh Narasimha; S. B. Rachaiah; Raghuveer M. Rao; P. R. Mukund (ISCAS (4), 2003)

LNA design optimization with reference to ESD protection circuitry. - S. Sridharan; Ghanshyam Nayak; P. R. Mukund (ISCAS (1), 2003)

Dynamic Input Match Correction in RF Low Noise Amplifiers. - Tejasvi Das; Anand Gopalan; Clyde Washburn; P. R. Mukund (DFT, 2004)

DREAM: A Chip-Package Co-Design Tool for RF-Mixed Signal Systems. - Ghanshyam Nayak; Tejasvi Das; T. M. Rao; P. R. Mukund (ISVLSI, 2004)

A compensation technique for transistor mismatch in current mirrors. - Sripriya R. Bandi; Ponnathpur R. Mukund (SoCC, 2004)

A generic macromodel for coupling between inductors and interconnects for R.F.I.C. layouts. - Tejasvi Das; Ghanshyam Nayak; Ponnathpur R. Mukund (SoCC, 2004)

A Tuned Wideband LNA in 0.25µm IBM Process For RF Communication Applications. - M. Benmansour; P. R. Mukund (VLSI Design, 2004)

A Low Noise Current-mode Readout circuit for CMOS Image Sensing Applications. - Tejasvi Das; P. R. Mukund (VLSI Design, 2004)

Chip Package Co-Design of a Heterogeneously Integrated 2.45GHz CMOS VCO using Embedded Passives in a Silicon Package. - Ghanshyam Nayak; P. R. Mukund (VLSI Design, 2004)

A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems. - Antonija Soldo; Anand Gopalan; P. R. Mukund; Martin Margala (VLSI Design, 2004)

Accurate performance prediction of multi-GHz CML with data run-length variations. - Sripriya R. Bandi; Clyde Washburn; P. R. Mukund; Jan Kolnik; Minxuan Liu; Ken Paradis; Steve Howard; Jeff Burleson (ISCAS (5), 2005)

Use of source degeneration for non-intrusive BIST of RF front-end circuits. - Anand Gopalan; Tejasvi Das; Clyde Washburn; Ponnathpur R. Mukund (ISCAS (5), 2005)

Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. - Tejasvi Das; Clyde Washburn; P. R. Mukund; Steve Howard; Ken Paradis; Jung-Geau Jang; Jan Kolnik; Jeff Burleson (VLSI Design, 2005)

An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. - Anand Gopalan; Tejasvi Das; Clyde Washburn; P. R. Mukund (VLSI Design, 2005)

System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models. - Ghanshyam Nayak; Clyde Washburn; P. R. Mukund (VLSI Design, 2005)

A current based self-test methodology for RF front-end circuits. - Anand Gopalan; Martin Margala; P. R. Mukund (Microelectron. J., 2005)

Self-calibration of input-match in RF front-end circuitry. - Tejasvi Das; Anand Gopalan; Clyde Washburn; Ponnathpur R. Mukund (IEEE Trans. Circuits Syst. II Express Briefs, 2005)

1/f noise synthesis model in discrete-time for circuit simulation. - Rajesh Narasimha; Sripriya R. Bandi; Raghuveer M. Rao; Ponnathpur R. Mukund (IEEE Trans. Circuits Syst. I Regul. Pap., 2005)

Self-calibration of gain and output match in LNAs. - Tejasvi Das; Ponnathpur R. Mukund (ISCAS, 2006)

An analytical propagation delay model with power supply noise effects. - Mark Pude; Clyde Washburn; Ponnathpur R. Mukund; Kouichi Abe; Yoshinori Nishi (ISCAS, 2006)

A universal common-source and common-drain model for 1-20GHz frequency range. - S. Sridharan; Sripriya R. Bandi; Clyde Washburn; Ponnathpur R. Mukund; Jan Kolnik; Ken Paradis; Steve Howard; Jeff Burleson (ISCAS, 2006)

Towards Fault-Tolerant RF Front Ends. - Tejasvi Das; Anand Gopalan; Clyde Washburn; P. R. Mukund (J. Electron. Test., 2006)

Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry. - Tejasvi Das; P. R. Mukund (DATE, 2007)

From Film to Silicon: The Migration of Document Archiving Technology. - P. R. Mukund (SoCC, 2010)

Passive and Active Reduction Techniques for On-Chip High-Frequency Digital Power Supply Noise. - Eric Bohannon; Christopher Urban; Mark Pude; Yoshinori Nishi; Anand Gopalan; Ponnathpur R. Mukund (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Scaling the bulk-driven MOSFET into deca-nanometer bulk CMOS processes. - Christopher Urban; James E. Moon; Ponnathpur R. Mukund (Microelectron. Reliab., 2011)

Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant Direct Tunneling-Induced Gate Current. - Eric Bohannon; Clyde Washburn; Ponnathpur R. Mukund (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

An ultra-thin oxide sub-1 V CMOS bandgap voltage reference. - Eric Bohannon; Clyde Washburn; P. R. Mukund (Int. J. Circuit Theory Appl., 2014)

A comparative study of multi-GHz LCVCOs designed in 28nm CMOS technology. - Evan K. Jorgensen; P. R. Mukund (SoCC, 2015)

Positive feedback for gain enhancement in sub-100 nm multi-GHz CMOS amplifier design. - Mark Pude; P. R. Mukund; Jeff Burleson (Int. J. Circuit Theory Appl., 2015)

A sub 1-volt subthreshold bandgap reference at the 14 nm FinFET node. - Lucas Prilenski; P. R. Mukund (Microelectron. J., 2018)