Comments on "Multiple Fault Detection in Combinational Networks". - Prabhakar Goel; Daniel P. Siewiorek (IEEE Trans. Computers, 1974)

Test generation costs analysis and projections. - Prabhakar Goel (DAC, 1980)

PODEM-X: An automatic test generation system for VLSI logic structures. - Prabhakar Goel; Barry C. Rosales (DAC, 1981)

An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits. - Prabhakar Goel (IEEE Trans. Computers, 1981)

Electronic Chip-in-Place Test. - Prabhakar Goel; M. T. McMahon (DAC, 1982)

A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. - Sumit DasGupta; Prabhakar Goel; Ron G. Walther; Tom W. Williams (ITC, 1982)

Testability Analysis will not Replace Fault Simulation. - Prabhakar Goel (ITC, 1984)

Statistical Fault Sampling and Full Fault Simulation. - Prabhakar Goel; Chi-Lai Huang (ITC, 1985)

Application of Parallel Processing to Fault Simulation. - Prabhakar Goel; Chi-Lai Huang; Robert E. Blauth (ICPP, 1986)

Benchmarking of Test-Generation Systems. - Prabhakar Goel; Harry Chen (COMPCON, 1988)