Modeling ASIC memories in VHDL. - Ekambaram Balaji; Prabhu Krishnamurthy (EURO-DAC, 1996)

Impact of Multiple-Detect Test Patterns on Product Quality. - Brady Benware; Chris Schuermyer; Sreenevasan Ranganathan; Robert Madge; Prabhu Krishnamurthy; Nagesh Tamarapalli; Kun-Han Tsai; Janusz Rajski (ITC, 2003)

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)

The Ultimate Chase. - Prabhu Krishnamurthy (Asian Test Symposium, 2005)