Feature extraction and damage-precursors for prognostication of lead-free electronics. - Pradeep Lall; Madhura Hande; Chandan Bhat; Nokibul Islam; Jeff Suhling; Jay Lee (Microelectron. Reliab., 2007)

Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads. - Pradeep Lall; Madhura Hande; Chandan Bhat; Vikrant More; Rahul Vaidya (Microelectron. Reliab., 2009)

Guest Editorial. - Robert Neal Dean; Pradeep Lall; Mathias Nowottnick; William R. Harrell (IEEE Trans. Ind. Electron., 2011)

Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads. - Pradeep Lall; Chandan Bhat; Madhura Hande; Vikrant More; Rahul Vaidya; Kai Goebel (IEEE Trans. Ind. Electron., 2011)

Prognostics Health Management of Electronic Systems Under Mechanical Shock and Vibration Using Kalman Filter Models and Metrics. - Pradeep Lall; Ryan Lowe; Kai Goebel (IEEE Trans. Ind. Electron., 2012)

Decorrelated Feature Space and Neural Nets Based Framework for Failure Modes Clustering in Electronics Subjected to Mechanical Shock. - Pradeep Lall; Prashant Gupta; Kai Goebel (IEEE Trans. Reliab., 2012)

Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration. - Pradeep Lall; Ryan Lowe; Kai Goebel (IEEE Trans. Reliab., 2012)

Prognostication of solder-joint reliability of 0.4mm and 0.5mm pitch bgas subjected to mechanical shocks up to 10, 000G. - Pradeep Lall; Kalyan Dornala; Junchao Wei; Ryan Lowe; Jason Foley (ICPHM, 2015)

Prognostication of LED remaining useful life and color stability in the presence of contamination. - Pradeep Lall; Hao Zhang; Lynn Davis (ICPHM, 2015)

Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging. - Pradeep Lall; Peter Sakalaukus; Lynn Davis (IEEE Access, 2015)

ANN based RUL assessment for copper-aluminum wirebonds subjected to harsh environments. - Pradeep Lall; Shantanu Deshpande; Luu Nguyen (ICPHM, 2016)

Prognostication of remaining useful-life for flexible batteries in foldable wearable electronics. - Pradeep Lall; Hao Zhang (ICPHM, 2016)

High strain rate constitutive behavior of SAC105 and SAC305 leadfree solder during operation at high temperature. - Pradeep Lall; Di Zhang; Vikas Yadav; David Locker (Microelectron. Reliab., 2016)

Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging. - Muhannad Mustafa; Jeffrey C. Suhling; Pradeep Lall (Microelectron. Reliab., 2016)

Prognostics health management of electronic systems - A reliability physics approach. - Pradeep Lall; Kazi Mirza; David Locker (IRPS, 2018)

PHM of state-of-charge for flexible power sources in wearable electronics with EKF. - Pradeep Lall; Hao Zhang; Rahul Lall (IRPS, 2018)

Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates. - Pradeep Lall; Ved Soni; Guneet Sethi; Kok Yiang (IRPS, 2023)

Cell Lifetime Degradation Model Development for Li-Ion Coin Cells considering Calendar Aging and Post-Knee Degradation (Invited). - Pradeep Lall; Ved Soni (IRPS, 2024)