Test generation for comprehensive testing of linear analog circuits using transient response sampling. - Pramodchandran N. Variyam; Abhijit Chatterjee (ICCAD, 1997)

FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. - Pramodchandran N. Variyam; Abhijit Chatterjee (VLSI Design, 1997)

Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. - Pramodchandran N. Variyam; Abhijit Chatterjee; Naveena Nagi (VTS, 1997)

Specification-Driven Test Design for Analog Circuits. - Pramodchandran N. Variyam; Abhijit Chatterjee (DFT, 1998)

Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. - Pramodchandran N. Variyam; Abhijit Chatterjee (VTS, 1998)

Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. - Heebyung Yoon; Pramodchandran N. Variyam; Abhijit Chatterjee; Naveena Nagi (VTS, 1998)

Test Generation for Analog Circuits Using Partial Numerical Simulation. - Pramodchandran N. Variyam; Junwei Hou; Abhijit Chatterjee (VLSI Design, 1999)

Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. - Pramodchandran N. Variyam; Junwei Hou; Abhijit Chatterjee (VTS, 1999)

Increasing the IDDQ test resolution using current prediction. - Pramodchandran N. Variyam (ITC, 2000)

Measuring code edges of ADCs using interpolation and its application to offset and gain error testing. - Pramodchandran N. Variyam; Vinay Agrawal (ITC, 2000)

Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. - Pramodchandran N. Variyam; Abhijit Chatterjee (IEEE Des. Test Comput., 2000)

Specification-driven test generation for analog circuits. - Pramodchandran N. Variyam; Abhijit Chatterjee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)

Measuring Stray Capacitance on Tester Hardware. - Achintya Halder; Abhijit Chatterjee; Pramodchandran N. Variyam; John Ridley (VTS, 2002)

Prediction of analog performance parameters using fast transienttesting. - Pramodchandran N. Variyam; Sasikumar Cherubal; Abhijit Chatterjee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Automatic Diagnostic Program Generation for Mixed Signal Load Board. - Kranthi K. Pinjala; Bruce C. Kim; Pramodchandran N. Variyam (ITC, 2003)

Partial Bi-Immunity and NP-Completeness - John M. Hitchcock; Aduri Pavan; Pramodchandran N. Variyam (Electron. Colloquium Comput. Complex., 2004)

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. - Ganesh Srinivasan; Sasikumar Cherubal; Pramodchandran N. Variyam; Melese Teklu; C. P. Wang; David Guidry; Abhijit Chatterjee (ETS, 2005)

DIBPro: Automatic Diagnostic Program Generation Tool. - Venkat Kalyanaraman; Bruce C. Kim; Pramodchandran N. Variyam; Sasikumar Cherubal (ITC, 2006)

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. - Ganesh Srinivasan; Abhijit Chatterjee; Sasikumar Cherubal; Pramodchandran N. Variyam (J. Electron. Test., 2010)