Complete test-set generation for bridging faults in combinational-logic circuits. - Sanjoy Kumar Basu; Jogesh Chandra Paul; Pramode Ranjan Bhattacharjee (Inf. Sci., 1986)

A novel design of sequential network to facilitate fault detection. - Pramode Ranjan Bhattacharjee; Sanjoy Kumar Basu; Jogesh Chandra Paul (Proc. IEEE, 1987)

Translation of the Problem of Complete Test Set Generation to Pseudo-Boolean Programming. - Pramode Ranjan Bhattacharjee; Sanjoy Kumar Basu; Jogesh Chandra Paul (IEEE Trans. Computers, 1991)

Quick detection of faults in combinational networks designed in minterm format by computing a single novel parameter. - Pramode Ranjan Bhattacharjee (Int. J. Comput. Math., 2009)