Analysis of Test Efficiency during Software Development Process - T. R. Gopalakrishnan Nair; V. Suma 001; Pranesh Kumar Tiwari (CoRR, 2012)

Significance of depth of inspection and inspection performance metrics for consistent defect management in software industry. - T. R. Gopalakrishnan Nair; V. Suma 001; Pranesh Kumar Tiwari (IET Softw., 2012)