Influence of test techniques on soft breakdown detection in ultra-thin oxides. - Douglas Brisbin; Prasad Chaparala (Microelectron. Reliab., 2002)

Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. - Barry O'Connell; Prasad Chaparala; Bhola Mehrotra (Microelectron. Reliab., 2004)

Influence of mobility model on extraction of stress dependent source-drain series resistance. - Merlyne M. De Souza; S. K. Manhas; D. Chandra Sekhar; A. S. Oates; Prasad Chaparala (Microelectron. Reliab., 2004)

Optimizing the hot carrier reliability of N-LDMOS transistor arrays. - Douglas Brisbin; Andy Strachan; Prasad Chaparala (Microelectron. Reliab., 2005)

Impact of NBTI and HCI on PMOSFET threshold voltage drift. - Prasad Chaparala; Douglas Brisbin (Microelectron. Reliab., 2005)