Wafer Defect Localization and Classification Using Deep Learning Techniques. - Prashant P. Shinde; Priyadarshini P. Pai; Shashishekar P. Adiga (IEEE Access, 2022)

What's My Age Again? Exploring the Impact of Age on the Enfacement of Current State-of-the-Art Avatars. - Hugh Jordan; Lauren E. Buck; Prashant P. Shinde; Rachel McDonnell (VR Workshops, 2023)

Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data. - Prashant P. Shinde; Priyadarshini P. Pai; Shashishekar P. Adiga; K. Subramanya Mayya; Yongbeom Seo; Myungsoo Hwang; Heeyoung Go; Changmin Park (CoRR, 2025)