Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. - Pratik B. Vyas; Ninad Pimparkar; Robert Tu; Wafa Arfaoui; Germain Bossu; Mahesh Siddabathula; Steffen Lehmann; Jung-Suk Goo; Ali B. Icel (IRPS, 2021)

Gate-All-Around SRAM: Performance Investigation and Optimization Towards Vccmin Scaling. - Pratik B. Vyas; Ashish Pal; Gregory Costrini; Benjamin Colombeau; Bala Haran; Subi Kengeri; El Mehdi Bazizi (IMW, 2024)

Material, Process and System Level Analysis for Parasitic Reduction of Next Generation Logic Technology in Conjunction with Backside Power Delivery. - Ashish Pal; Sefa Dag; Pratik B. Vyas; Gregory Costrini; Vinod Reddy; Veeraraghavan Basker; Allen Yeong; Benjamin Colombeau; Bala Haran; Subi Kengeri; El Mehdi Bazizi (VLSI Technology and Circuits, 2024)

Novel Material, Process and Device Innovations for Next Generation Silicon Carbide (SiC) Trench MOSFET Technology. - Pratik B. Vyas; Ludovico Megalini; Ashish Pal; Joshua Holt; Archana Kumar; Stephen Weeks; Charisse Zhao; Lucien Date; Hansel Lo; Michel Khoury; Safdar Muhammad; Fabian Piallat; et al. (VLSI Technology and Circuits, 2024)