FRITS - A Microprocessor Functional BIST Method. - Praveen Parvathala; Kaila Maneparambil; William Lindsay (ITC, 2002)

High Level Test Generation / SW based Embedded Test. - Praveen Parvathala (Asian Test Symposium, 2005)

On Silicon-Based Speed Path Identification. - Leonard Lee; Li-C. Wang; Praveen Parvathala; T. M. Mak (VTS, 2005)

A Functional Fault Model with Implicit Fault Effect Propagation Requirements. - Irith Pomeranz; Srinivas Patil; Praveen Parvathala (ATS, 2006)

A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests. - Sungchul Park; Li Chen; Praveen Parvathala; Srinivas Patil; Irith Pomeranz (ITC, 2006)

Session Abstract. - Praveen Parvathala (VTS, 2006)

Estimating the Fault Coverage of Functional Test Sequences Without Fault Simulation. - Irith Pomeranz; Praveen Parvathala; Srinivas Patil (ATS, 2007)