Incorporating Heterogeneous Redundancy in a Nanoprocessor for Improved Yield and Performance. - Priyamvada Vijayakumar; Pritish Narayanan; Israel Koren; C. Mani Krishna 001; Csaba Andras Moritz (DFT, 2010)

Biased Voting for Improved Yield in Nanoscale Fabrics. - Md. Muwyid U. Khan; Pritish Narayanan; Priyamvada Vijayakumar; Israel Koren; C. Mani Krishna 001; Csaba Andras Moritz (DFT, 2011)

On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements. - Vikram B. Suresh; Priyamvada Vijayakumar; Sandip Kundu (ISVLSI, 2011)

Lithography aware critical area estimation and yield analysis. - Priyamvada Vijayakumar; Vikram B. Suresh; Sandip Kundu (ITC, 2011)

Nanoscale Application Specific Integrated Circuits. - Pritish Narayanan; Jorge Kina; Pavan Panchapakeshan; Priyamvada Vijayakumar; Kyeong-Sik Shin; Mostafizur Rahman; Michael Leuchtenburg; Israel Koren; Chi On Chui; Csaba Andras Moritz (NANOARCH, 2011)

Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics. - Priyamvada Vijayakumar; Pritish Narayanan; Israel Koren; C. Mani Krishna 001; Csaba Andras Moritz (NANOARCH, 2011)

On lithography aware metal-fill insertion. - Vikram B. Suresh; Priyamvada Vijayakumar; Sandip Kundu (ISQED, 2012)