A BIST approach for counterfeit circuit detection based on NBTI degradation. - Puneet Ramesh Savanur; Phaninder Alladi; Spyros Tragoudas (DFTS, 2015)

Threshold Voltage Extraction Using Static NBTI Aging. - Puneet Ramesh Savanur; Spyros Tragoudas (DFT, 2018)

A Fault Model to Detect Design Errors in Combinational Circuits. - Puneet Ramesh Savanur; Spyros Tragoudas (DFT, 2021)