Statistical control of VLSI fabrication processes. - Purnendu K. Mozumder; Andrzej J. Strojwas (Proc. IEEE, 1990)

An Integrated Technology CAD System for Process and Device Designers. - K. S. V. Gopalarao; Uttiya Dasgupta; Rajeev Jain; Duane S. Boning; Purnendu K. Mozumder; V. Chandramouli (VLSI Design, 1993)

An integrated technology CAD system for process and device designers. - K. S. V. Gopalarao; Purnendu K. Mozumder; Duane S. Boning (IEEE Trans. Very Large Scale Integr. Syst., 1993)

Semiconductor wafer representation for TCAD. - Martin D. Giles; Duane S. Boning; Goodwin R. Chin; Walter C. Dietrich Jr.; Michael S. Karasick; Mark E. Law; Purnendu K. Mozumder; Lee R. Nackman; V. T. Rajan; Duncan M. Hank Walker; Robert H. Wang; Alexander S. Wong (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

A New Methodology for Concurrent Technology Development and Cell Library Optimization. - Marko P. Chew; Sharad Saxena; Thomas F. Cobourn; Purnendu K. Mozumder; Andrzej J. Strojwas (VLSI Design, 1999)