Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. - Petra Schmitt; Francis Pressecq; Xavier Lafontan; Q.-H. Duong; Patrick Pons; Jean Marc Nicot; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2003)

Thermal and electrostatic reliability characterization in RF MEMS switches. - Q.-H. Duong; Lionel Buchaillot; Dominique Collard; Petra Schmitt; Xavier Lafontan; Patrick Pons; F. Flourens; Francis Pressecq (Microelectron. Reliab., 2005)

Biaxial initial stress characterization of bilayer gold RF-switches. - K. Yacine; F. Flourens; David Bourrier; Ludovic Salvagnac; P. Calmont; Xavier Lafontan; Q.-H. Duong; Lionel Buchaillot; D. Peyrou; Patrick Pons (Microelectron. Reliab., 2005)