Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation. - Xiao Shi 001; Hao Yan 002; Qiancun Huang; Jiajia Zhang; Longxing Shi; Lei He 001 (DAC, 2019)

Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method. - Xiao Shi 001; Hao Yan 002; Jiajia Zhang; Qiancun Huang; Longxing Shi; Lei He 001 (ICCAD, 2019)

A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation. - Xiao Shi 001; Hao Yan 002; Qiancun Huang; Chengzhen Xuan; Lei He 001; Longxing Shi (ACM Trans. Design Autom. Electr. Syst., 2022)