Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress. - Xinze Li; Yuxuan Wu; Qiao Teng; Ying Sun; Xiao Gong; Guillaume Besnard; Christophe Maleville; Olivier Weber; Rui Zhang; Bing Chen; Dawei Gao; Ran Cheng (ICICDT, 2023)

Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells. - Qiao Teng; Yongyu Wu; Junzhe Kang; Kai Xu; Dawei Gao (IRPS, 2024)