Improved step stress accelerated life testing method for electronic product. - Qingchuan He; Wenhua Chen 003; Jun Pan; Ping Qian (Microelectron. Reliab., 2012)

Optimal Time-Censored Constant-Stress ALT Plan Based on Chord of Nonlinear Stress-Life Relationship. - Liang Gao 007; Wenhua Chen 003; Ping Qian; Jun Pan; Qingchuan He (IEEE Trans. Reliab., 2016)

A prognostic method for predicting failure of dc/dc converter. - Qingchuan He; Wenhua Chen 003; Jun Pan; Ping Qian (Microelectron. Reliab., 2017)

Early Performance Degradation Detecting Method for PMSM Based on Change in Frequency Domain Features of Three-Phase Stator Current. - Qingchuan He; Jun Pan; Xiaotian Lyu (IEEE Access, 2023)