SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images. - Fuqin Deng; Qiqing Dong; Junhan Pu; Lanhui Fu; Qingshan Xia; Zhi Xu; Nannan Li; Min Zhao (INDIN, 2025)

Multi Focus Image Fusion Network Based On Focus Attention And Dual Feature Adaptation. - Fuqin Deng; ZhengHong He; Lanhui Fu; Qingshan Xia; Zhi Xu; Nannan Li; ZhenBo Ren; Ping Su (INDIN, 2025)

Fabric-DETR: An Efficient Transformer Network for Multi-Scale Fabric Defect Detection in Complex Environments. - Fuqin Deng; Qingshan Xia; Lanhui Fu; Yingzhu Wu; Nannan Li 001; Ningbo Yi; Guangming You; Zhi Xu (INDIN, 2025)

Segment Anything in Industrial defect detection. - Fuqin Deng; Zhi Xu; Lanhui Fu; Min Zhao; Nannan Li; Song Lu; Hufei Zhu; Qingshan Xia (INDIN, 2025)