A cross-scale investigation on transient electrothermal performance for power MOSFETs at device-package level. - Yuxuan Dai; Jiafei Yao; Jing Chen 032; Maolin Zhang; Yucheng Xu; Qing Yao; Qingyou Qian; Jun Zhang 057; Kemeng Yang; Yufeng Guo (Microelectron. J., 2025)