Developing machine learning models with multi-source environmental data to predict wheat yield in China. - Linchao Li; Bin Wang 083; Puyu Feng; De Li Liu; Qinsi He; Yajie Zhang; Yakai Wang; Siyi Li; Xiaoliang Lu; Chao Yue; Yi Li; Jianqiang He; et al. (Comput. Electron. Agric., 2022)