High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications. - Quentin Courte; Martin Rack; M. Nabet; Pieter Cardinael; Jean-Pierre Raskin (ESSDERC, 2021)

Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. - Martin Rack; Lucas Nyssens; Quentin Courte; Dimitri Lederer; Jean-Pierre Raskin (ESSDERC, 2021)