Robustness study of 1700 V 45 mΩ SiC MOSFETs. - Quentin Molin; Mehdi Kanoun; Christophe Raynaud; Hervé Morel (ICIT, 2018)

Measurement and analysis of SiC-MOSFET threshold voltage shift. - Quentin Molin; Mehdi Kanoun; Christophe Raynaud; Hervé Morel (Microelectron. Reliab., 2018)