New parameter extraction method based on split C-V for FDSOI MOSFETs. - Imed Ben Akkez; Antoine Cros; Claire Fenouillet-Béranger; Frédéric Boeuf; Quentin Rafhay; Francis Balestra; Gérard Ghibaudo (ESSDERC, 2012)

Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime. - Gaspard Hiblot; Quentin Rafhay; Frédéric Boeuf; Gérard Ghibaudo (ESSDERC, 2014)

Optimization of Trigate-On-Insulator MOSFET aspect ratio with MASTAR. - Gaspard Hiblot; Quentin Rafhay; Loic Gaben; Gérard Ghibaudo; Frédéric Boeuf (ESSDERC, 2015)

On the impact of OxRAM-based synapses variability on convolutional neural networks performance. - Daniele Garbin; Elisa Vianello; Olivier Bichler; M. Azzaz; Quentin Rafhay; Philippe Candelier; Christian Gamrat; Gérard Ghibaudo; Barbara De Salvo; Luca Perniola (NANOARCH, 2015)

Impact of short-channel effects on velocity overshoot in MOSFET. - Gaspard Hiblot; Quentin Rafhay; Frédéric Boeuf; Gérard Ghibaudo (NEWCAS, 2015)

Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices. - Jessy Micout; Quentin Rafhay; Xavier Garros; Mikaël Cassé; Jean Coignus; Luca Pasini; Cao-Minh Vincent Lu; Nils Rambal; Claire Fenouillet-Béranger; Laurent Brunet; G. Romano; R. Gassilloud; et al. (ESSDERC, 2017)

Characterization and Modelling of High Speed Ge Photodetectors Reliability. - Fatoumata Sy; Quentin Rafhay; Julien Poëtte; Gregory Grosa; C. Besset; Gaelle Beylier; Philippe Grosse; David Roy; Jean-Emmanuel Broquin (IRPS, 2019)

Simulation Study of the Origin of Ge High Speed Photodetector Degradation. - Balraj Arunachalam; Jean-Emmanuel Broquin; Quentin Rafhay; David Roy; Anne Kaminski (IRPS, 2021)

High temperature stability embedded ReRAM for 2x nm node and beyond. - Gabriel Molas; Giuseppe Piccolboni; Alessandro Bricalli; Anthonin Verdy; I. Naot; Y. Cohen; Amir Regev; I. Naveh; Damien Deleruyelle; Quentin Rafhay; Niccolo Castellani; Lucas Reganaz; et al. (IMW, 2022)

Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability. - Lucas Reganaz; Damien Deleruyelle; Quentin Rafhay; Joel Minguet Lopez; Niccolo Castellani; Jean-François Nodin; Alessandro Bricalli; Giuseppe Piccolboni; Gabriel Molas; François Andrieu (IRPS, 2023)