A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. - Steven H. Voldman; W. Anderson; R. Ashton; M. Chaine; Charvaka Duvvury; T. Maloney; E. Worley (Microelectron. Reliab., 2001)

A simulation-based study of a NHS Walk-in Centre. - R. Ashton; L. Hague; M. Brandreth; David J. Worthington; Stephen Cropper (J. Oper. Res. Soc., 2005)