Automated Cartography and Geographical Information Systems. - R. Barr (Advances in Computer Graphics, 1986)

3 Factor Accelerated Lifetime Testing in Lateral GaN Power HEMTs: A Tutorial. - S. Wienecke; R. Barr; W. Cruse; A. Wong; L. Shen; P. Smith; K. Shono; R. Lal; G. Gupta; Davide Bisi; C. Neufeld (IRPS, 2025)