Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. - G. Ghidini; A. Garavaglia; G. Giusto; Andrea Ghetti; R. Bottini; D. Peschiaroli; M. Scaravaggi; F. Cazzaniga; Daniele Ielmini (Microelectron. Reliab., 2003)

Impact of interface and bulk trapped charges on transistor reliability. - G. Ghidini; M. Langenbuch; R. Bottini; D. Brazzelli; Andrea Ghetti; N. Galbiati; G. Giusto; A. Garavaglia (Microelectron. Reliab., 2005)

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability. - M. Langenbuch; R. Bottini; Maria Elena Vitali; G. Ghidini (Microelectron. Reliab., 2005)

High voltage transistor degradation in NVM pump application. - Roberta Bottini; Sonia Costantini; Nadia Galbiati; Andrea Ghetti; Gabriella Ghidini; Aurelio Giancarlo Mauri; Claudia Scozzari; Alessandro Sebastiani (Microelectron. Reliab., 2007)

Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs. - Roberta Bottini; Andrea Ghetti; Sara Vigano; Maria Grazia Valentini; Pratap Murali; Chandra Mouli (IRPS, 2018)