An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso (ETS, 2008)

Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso; Edgar E. Sánchez; Matteo Sonza Reorda (ETS, 2009)