Superior Endurance Performance of 22-nm Embedded MRAM Technology. - Vinayak Bharat Naik; J. H. Lim; K. Yamane; Dinggui Zeng; H. Yang; N. Thiyagarajah; Jae Hyun Kwon; N. L. Chung; R. Chao; T. Ling; K. Lee (IRPS, 2019)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)