Built-in self-test methodology for A/D converters. - R. de Vries; Taco Zwemstra; E. M. J. G. Bruls; Paul P. L. Regtien (ED&TC, 1997)

Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling. - R. de Vries; Augustus J. E. M. Janssen (J. Electron. Test., 1999)

Towards a (Max, +) Control Theory for Public Transportation Networks. - Bernd Heidergott; R. de Vries (Discret. Event Dyn. Syst., 2001)

Bayesian structural reliability updating using a population track record. - R. de Vries; Raphaël D. J. M. Steenbergen; A. C. W. M. Vrouwenvelder (Reliab. Eng. Syst. Saf., 2025)