High-resolution in-situ of gold electromigration: test time reduction. - Kris Croes; R. Dreesen; Jean Manca; Ward De Ceuninck; Luc De Schepper; Luc Tielemans; P. J. van der Wel (Microelectron. Reliab., 2001)

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. - R. Dreesen; Kris Croes; Jean Manca; Ward De Ceuninck; Luc De Schepper; A. Pergoot; Guido Groeseneken (Microelectron. Reliab., 2001)

Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. - Philippe Soussan; G. Lekens; R. Dreesen; Ward De Ceuninck; Eric Beyne (Microelectron. Reliab., 2003)