Limits of nano-gate fabrication. - David R. Allee; Alec N. Broers; R. Fabian W. Pease (Proc. IEEE, 1991)

Exploiting structure in positioning of nonsymmetric signals. - Amir A. Ghazanfarian; Xun Chen; Thomas Kailath; Mark A. McCord; R. F. W. Pease (ICASSP, 1998)

Self-consistent power/performance/reliability analysis for copper interconnects. - Bipin Rajendran; Pawan Kapur; Krishna Saraswat; R. Fabian W. Pease (SLIP, 2004)

Effect of nanoimprinted surface relief on Si and Ge nucleation and ordering. - Theodore I. Kamins; Amir A. Yasseri; Shashank Sharma; R. Fabian W. Pease; Qiangfei Xia; Stephen Y. Chou (Microelectron. J., 2006)

Lithography and Other Patterning Techniques for Future Electronics. - R. Fabian W. Pease; Stephen Y. Chou (Proc. IEEE, 2008)