Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs. - Denis Rideau; Wilfried Uhring; R. A. Bianchi; Rémi Helleboid; Gabriel Mugny; Jérémy Grebot; Jean-Robert Manouvrier; R. Neri; F. Brun; Mohammadreza Dolatpoor Lakeh; Sven Rink; Jean-Baptiste Kammerer; et al. (ESSDERC, 2023)

Influence of Process Integration on pBTI Degradation in Analog SOI nMOSFETs. - Abygaël Viey; William Vandendaele; P. Kouaté Wafo; Xavier Garros; Luigi Basset; F. Ponthenier; Joris Lacord; R. Fillon; X. Federspiel; D. Roy; S. Joblot; Dominique Golanski (IRPS, 2025)