Switching times variation of power MOSFET devices after electrical stress. - R. Habchi; C. Salame; P. Mialhe; A. Khoury (Microelectron. Reliab., 2007)

Switching times variation of MOSFET devices with temperature and high-field stress. - R. Habchi; C. Salame; R. El Bitar; P. Mialhe (Microelectron. J., 2008)