A Hardware Device for Generalized Mapping Functions. - M. W. Allen; R. J. Potter (IEEE Trans. Electron. Comput., 1966)

Charge trapping and interface states in hydrogen annealed HfO2-Si structures. - Y. V. Gomeniuk; A. N. Nazarov; Ya. N. Vovk; V. S. Lysenko; Yi Lu; Octavian Buiu; Steve Hall; R. J. Potter; Paul R. Chalker (Microelectron. Reliab., 2007)

Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition. - Y. Lu; Octavian Buiu; Steve Hall; Ivona Z. Mitrovic; W. Davey; R. J. Potter; Paul R. Chalker (Microelectron. Reliab., 2007)

Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition. - P. Taechakumput; Stephen Taylor; Octavian Buiu; R. J. Potter; Paul R. Chalker; A. C. Jones (Microelectron. Reliab., 2007)