Automated Palynological Analysis System: Integrating Deep Metric Learning and U2-Net Detection in H∞ bright field microscopy. - J. Staforelli-Vivanco; R. Jofré; Benjamín Muñoz; V. Salamanca; Pablo Coelho; Ignacio Sanhueza; L. Viafora; Carlos Toro 002; J. Troncoso; M. Rondanelli-Reyes; I. Lamas (CoRR, 2026)