CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. - Jerry M. Soden; R. Keith Treece; Michael R. Taylor; Charles F. Hawkins (ITC, 1989)

Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. - Ronald R. Fritzemeier; Jerry M. Soden; R. Keith Treece; Charles F. Hawkins (ITC, 1990)