Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. - Alberto Castellazzi; R. Kraus; Norbert Seliger; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2002)

Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. - Alberto Castellazzi; V. Kartal; R. Kraus; Norbert Seliger; Martin Honsberg-Riedl; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2003)

MOSAIC a web-based modeling environment for code generation. - Stefan Kuntsche; Tilman Barz; R. Kraus; Harvey Arellano-Garcia; Günter Wozny (Comput. Chem. Eng., 2011)