Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. - R. Lavieville; Theano A. Karatsori; Christoforos G. Theodorou; Sylvain Barraud; C. A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2016)

Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). - William Vandendaele; Camille Leurquin; R. Lavieville; Marie-Anne Jaud; Abygaël Viey; Romain Gwoziecki; B. Mohamad; Etienne Nowak; Aurore Constant; Ferdinando Iucolano (IRPS, 2023)