Macro-testability and the VSP. - R. Mehtani; Keith Baker; C. M. Huizer; P. J. Hynes; Jos van Beers (ITC, 1990)

Improving Total IC Design Quality Using Application Mode Testing. - R. Mehtani; M. De Jonghe; Richard Morren; Keith Baker (ITC, 1992)

Mix Test: A Mixed-Signal Extension to a Digital Test System. - R. Mehtani; Bert Atzema; M. De Jonghe; Richard Morren; Geert Seuren; Taco Zwemstra (ITC, 1993)