Guest Editorial. - R. Murphy; Erik Meijering; Gaudenz Danuser (IEEE Trans. Image Process., 2005)

Variability in Fully Depleted MOSFETs. - Maud Vinet; T. Hook; Yannick Le Tiec; R. Murphy; Shom Ponoth; Laurent Grenouillet; Romain Wacquez (ICICDT, 2012)