Designing and Implementing an Architecture with Boundary Scan. - R. P. van Riessen; Hans G. Kerkhoff; A. Kloppenburg (IEEE Des. Test Comput., 1990)

A design-for-testability expert system for silicon compilers. - R. P. van Riessen; Hans G. Kerkhoff; J. M. J. Janssen (VTS, 1991)