A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. - R. Pagano; Salvatore Lombardo; Felix Palumbo; Paul Kirsch; S. A. Krishnan; Chadwin D. Young; Rino Choi; Gennadi Bersuker; James H. Stathis (Microelectron. Reliab., 2008)

CY5 fluorescence measured with silicon photomultipliers. - Maria Francesca Santangelo; S. La Cono; P. Vasquez; Giorgio Fallica; Sabrina Conoci; A. C. Busacca; R. Pagano; Emanuele L. Sciuto; Salvatore Lombardo; Sebania Libertino (BioCAS, 2014)