Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. - Sergey Bychikhin; Martin Litzenberger; R. Pichler; Dionyz Pogany; Erich Gornik; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2001)

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. - Martin Litzenberger; R. Pichler; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Kai Esmark; Harald Gossner (Microelectron. Reliab., 2001)

Communication Patterns in Innovation Ecosystems: A Data Space Design Framework. - M. Schellander; M. Pöltl; M. Heiss; R. Pichler; F. Haas (IEEM, 2024)