Analyzing testability from behavioral to RT level. - Marie-Lise Flottes; R. Pires; Bruno Rouzeyre (ED&TC, 1997)

Alleviating DFT Cost Using Testability Driven HLS. - Marie-Lise Flottes; R. Pires; Bruno Rouzeyre (Asian Test Symposium, 1998)

Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique. - Marie-Lise Flottes; R. Pires; Bruno Rouzeyre; Laurent Volpe (DATE, 1998)

Low Cost Partial Scan Design: A High Level Synthesis Approach. - Marie-Lise Flottes; R. Pires; Bruno Rouzeyre; Laurent Volpe (VTS, 1998)