Case study: Failure analysis for metal corrosion induced by pressure pot test. - Domenico Mello; R. Ricciari; M. Aiello; M. Astuto (Microelectron. Reliab., 2010)

Case study of failure analysis in thin film silicon solar cell. - Domenico Mello; R. Ricciari; A. Battaglia; Marina Foti; Cosimo Gerardi (Microelectron. Reliab., 2015)

Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. - R. Ricciari; E. P. Ferlito; G. Pizzo; M. Padalino; G. Anastasi; M. Sacchi; G. Pappalardo; C. Consalvo; Domenico Mello (Microelectron. Reliab., 2015)

Advanced Characterization of p/n Junctions in SiC. - G. Johnson; A Rummel; H. Stegmann; P. Barbarino; C. Poltronieri; G. Sciuto; M. Astuto; Giancarlo Calvagno; R. Ricciari (IRPS, 2025)