Student Realization in Cleanroom of Silicon-Germanium Thin Film Transistors. - D. Guillet; K. Mourgues; R. Rogel; H. Lhermite; Olivier Bonnaud (MSE, 1999)

Reliability improvement of high value doped polysilicon-based resistors. - E. Carvou; F. Le Bihan; Anne Claire Salaün; R. Rogel; Olivier Bonnaud; Yannick Rey-Tauriac; Xavier Gagnard; L. Roland (Microelectron. Reliab., 2002)